Name in Full : DR. KAMLESH KUMAR MAURYA

Designation: : Senior Principal Scientist & Professor, AcSIR

Deputy Head, Bharatiya Nirdeshk Dravya

Department : Bharatiya Nirdeshk Dravya (BND^)

National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi-110012,

Sub-Division : RMP Outreach

Email: : kkmaurya@nplindia.org ; Ph.: 91-11-45608295

Joining of CSIR-NPL: 12^th August 1997

Educational qualifications:

Ph.D. (1993) : Physics, Banaras Hindu University (BHU), Varanasi, India

M.Sc. (1988) : Physics (solid-state) Banaras Hindu University (BHU), Varanasi, India

B.Sc.(Hons.) (1985) : Physics, Banaras Hindu University (BHU), Varanasi, India

Fellowship

 

• Senior Research Fellowship, CSIR, New Delhi, (Jan., 1992 - Dec.,1994)

 

• Research Associate Fellowship, CSIR, New Delhi, (Jan.,1995 - Nov.,1996)

Abroad Visit

 

• Taiwan National University(NTU) : Post Doctoral Fellow June 2006- May 2007

 

• The Netherlands : HRXRD Training 6-19 Nov., 2011

Scientific Carrier

1997-2002 : Junior Scientist

2002-2006 : Scientist

2006-2010 : Senior Scientist

2010- 2016 : Principal Scientist

2016-Present : Senior Principal Scientist

Research Experience During PhD:

 

• Four new proton conducting polymer electrolytes were developed and characterized

during PhD.

 

• Prototype devices like fuel cell, hydrogen sensor and humidity sensor were fabricated using these new polymer electrolytes and tested under laboratory conditions.

Present Research Experience:

 

• Growth of technologically important single crystals by CZ technique like pure lithium niobate, lithium niobate doped with iron and zinc, BSO, LiF, alkali halides: NaCl, KCl, KBr and NLO single crystals by SEST technique etc etc.

 

• High resolution X-ray diffractometry (HRXRD) and X-ray reflectometry studies of as-grown and processed single crystals, epitaxial and polycrystalline/amorphous thin films.

 

• Double crystal X-ray diffractometry and topography of single crystals and thin films.

 

• Structural characterization of multilayer quantum wells grown by MBE, MOCVD using high resolution X-ray diffractometry (HRXRD) and XRR.

Notable achievements:

 

1. A new RF machine for high temperature crystal growth up to 1300 ⁰C was integrated successfully with in-house developed Czochralski crystal puller for growth of bigger diameter lithium niobate single crystals up to ~50 mm. The RF heating control was interfaced with a Eurotherm temperature controller to control temperature precisely during crystal growth. Also, a co-axial post growth resistive heater was installed with RF coil to modify the heating zone.

 

2. Large number of technologically important big size single crystals of LiF, LiNbO₃, BSO, Benzophenone etc by Czochralski (CZ) technique have been grown and characterized by HRXRD. Iron doped lithium niobate results was published as a hot article by RSC in crystengcomm blog for its reported crystalline perfection.

 

3. Large number of nonlinear optical organic and semiorganic NLO single crystals like Benzimidazole, glycine picrate, l-proline cadmium chloride monohydrate, potassium dihydrogen phosphate (KDP) doped with L-threonine (LT), L-asparagine monohydrate, L-cysteine hydrochloride monohydrate, pure and doped ZTS, L-lanine, L-histidine nitrate, trans-stilbene etc have been grown by solution growth (SEST) methods and characterized by HRXRD.

 

4. Anodically bonded silicon onto glass by ion-cut technique was characterized using HRXRD.

 

5. Specially made PZT thin films on Pt(111) (150nm)/TiO₂ (20nm)/SiO₂ (300nm)/ (100)Si (675μm) substrates were characterized using GIXRD and XRR technique.

 

6. Real LED structures based on GaN/AlGaN/InGaN made by CEERI were characterized using HRXRD & RSM and the parameters like composition, thickness of layers relaxation were obtained after simulation of the HRXRD results.

 

7. Variety of thin films of GaN grown on sapphire substrate by NPL MBE was characterized using HRXRD and RSM.

 

8. HRXRD and RSM characterization of different manganites thin films like SSMO, LCMO, LSMO, NSMO etc. deposited at NPL by magnetron sputtering on different single crystal substrates like LAO, STO etc were performed.

 

9. An expertise has been developed to determine accurate film thickness of thin and ultra thin films (of the order of 1-2 nm) successfully non-destructively using X-ray reflectometry (XRR) technique along with roughness of surface and interface of the film.

Contributions to AcSIR Academy:

 

• Teaching the course on HRXRD for PhD students, conducting exams, preparing results etc.

 

• Prepared the syllabus on “Advanced Materials Characterization Techniques” for full-time PhD students as their course work.

Membership of Professional Societies/Institutions:

Publications: > 100 Sci Publications

Papers presented in conferences/Seminars/workshops: >35

Invited Talks: >10