Dr. M. Senthil Kumar
Principal Scientist
Advanced Materials and Device Metrology Division
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Brief Biodata:

Dr M. Senthil Kumar

Designation: Senior Scientist

Division: Advanced Materials & Device Metrology

Sub-Division: Thin Film Devices & Metrology

Contact Number: + 91-11-42342435


Educational Qualification: M.Sc. & M.Phil. (Physics), Ph.D. (Material Science)

Academic Qualifications: Post-Doctoral Researcher at Japan and Korea (2002-2009)

Research Experience:

  • Development of III-Nitride Epitaxial Layers and Heterostructures for Blue/Green LED and HEMT applications by PAMBE and MOCVD techniques.
  • Process development for III-Nitride Layers using Laser MBE technique.
  • Metal-Semiconductor and Metal-Oxide-Semiconductor structures on III-V Semiconductors
  • Development of GaN, ZnO of CNT nanostructures for FET, Field Emission and Photo-catalytic applications

Current Activity: Development of Solid State Gas Sensors for Atmospheric pollutants

Publications: SCI Journals – 55; Book Chapters - 02